Synchrotron Radiation
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1. Introduction
2. ptb laboratory at bessy ii and dedicated beamlines for the characterization of spos, 3. reflectance measurements at the fcm beamline, 4. conclusions and outlook.
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| JOURNAL OF SYNCHROTRON RADIATION |
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Characterization of silicon pore optics for the NewAthena X-ray observatory in the PTB laboratory at BESSY II
a Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany, b cosine Research BV, Warmonderweg 14, 2171 AH Sassenheim, The Netherlands, and c ESTEC, Keplerlaan 1, 2200 AG Noordwijk, The Netherlands * Correspondence e-mail: [email protected]
This article forms part of a virtual special issue containing papers presented at the PhotonMEADOW2023 workshop.
The New Advanced Telescope for High ENergy Astrophysics (NewAthena) will be the largest space-based X-ray observatory ever built. It will have an effective area above 1.1 m 2 at 1 keV, which corresponds to a polished mirror surface of about 300 m 2 due to the grazing incidence. As such a mirror area is not achievable with an acceptable mass even with nested shells, silicon pore optics (SPO) technology will be utilized. In the PTB laboratory at BESSY II, two dedicated beamlines are in use for their characterization with monochromatic radiation at 1 keV and a low divergence well below 2 arcsec: the X-ray Pencil Beam Facility (XPBF 1) and the X-ray Parallel Beam Facility (XPBF 2.0), where beam sizes up to 8 mm × 8 mm are available while maintaining low beam divergence. This beamline is used for characterizing mirror stacks and controlling the focusing properties of mirror modules (MMs) – consisting of four mirror stacks – during their assembly at the beamline. A movable CCD based camera system 12 m from the MM registers the direct and the reflected beams. The positioning of the detector is verified by a laser tracker. The energy-dependent reflectance in double reflection through the pores of an MM with an Ir coating was measured at the PTB four-crystal monochromator beamline in the photon energy range 1.75 keV to 10 keV, revealing the effects of the Ir M edges. The measured reflectance properties are in agreement with the design values to achieve the envisaged effective area.
Keywords: silicon pore optics ; optics characterization ; X-ray reflectance ; X-ray optics characterization .
| Section of the X-ray lens for Athena, composed of MMs grouped in 15 rows depending on the radius. |
In this paper, the dedicated beamlines XPBF 1 and XPBF 2.0 for the characterization and assembly of MMs in the PTB laboratory at BESSY II are described as well as the energy-dependent reflectance measurements of an Ir-coated MM in the spectral range from 1.75 keV to 10 keV. X-ray fluorescence measurements on the top surface are also presented. An outlook is given for the mass-production of MMs at additional beamlines and future measurements.
Parameters of the dedicated beamlines XPBF 1 and XPBF 2.0 | | XPBF 1 | XPBF 2.0 | Photon energy (keV) | 1.0 | 1.0 | Monochromatization/collimation | 2W/B C flat multilayer mirrors and pinholes | W/Si multilayer coating on a toroidal mirror | Multilayer -spacing (nm) | 1.1 | 4.4 | Multilayer Bragg angle (°) | 15, vertical deflection | 8.5, horizontal deflection | Beam size (with divergence <2 arcsec) | Typically 0.1 mm diameter | Up to 8 mm × 8 mm | Sample chamber diameter (mm) | 600 | 700 | Sample chamber height (mm) | 780 | 1060 | Sample chamber door diameter (mm) | 400 (one door) | 600 (two doors) | Horizontal sample translation (mm) | 100 | 120 | Vertical sample translation | 150 | 150 | Electronic autocollimators | 2 | 2 | Sample-to-detector distance (m) | 5 | 12 | Detector vertical translation (mm) | 370 | 2100 | Detector horizontal translation (mm) | 60 | 165 | Detector translation in the beam direction (mm) | 0 | 1000 | CCD pixel number | 1300 × 1340 | 2048 × 2048 | CCD pixel size (µm) | 20 | 13.5 | Laser tracker for detector | No | Yes | | | MM assembly at XPBF 2.0 using three small hexapods to align the mirror stacks: OS (outer secondary), IP (inner primary) and IS (inner secondary) with respect to OP (outer primary). For the alignment with X-rays, the setup is placed on the main hexapod in the vacuum sample chamber. | | ( ) Drawing of the vacuum sample chamber at XPBF 2.0 with the main hexapod and two electronic autocollimators and CCD-based detector system on the vertical translation stage at a distance of 12 m from the chamber in the position for the ( ) direct beam and ( ) the reflected beam. | | Layout of the FCM beamline in the PTB laboratory at BESSY II with the attached UHV reflectometer. | | ( ) Fully assembled MM in the reflectometer. In the beam direction, the pores of the MM can be seen as well as the goniometer head for alignment on the left and the semiconductor photodiodes for the reflectance measurements in the back. ( ) From a top view, the coating stripes on the top surface and the SDD for the XRF detection are visible. | | ( ) XRF spectra obtained at an incident energy of 3.6 keV from an Ir-coated stripe and from an uncoated stripe above the ribs. ( ) Normalized fluorescence intensities from a scan across the central region of the top surface. | | Scan over the total width of the MM in double reflection at 4 keV for a grazing incidence angle of 0.814°. The reflectance is about 35% on the Ir-coated stripes, and it vanishes when the beam is blocked by the ribs. The curvature of the stack, with a radius of about 0.7 m, caused the beam to be blocked by the reflecting plate around the 95 mm and 120 mm positions before it is reflected by the plate below. | | Energy-dependent reflectance (double reflection) at different positions (pores) of the MM. In the linear plot ( ), the Ir edges are clearly visible. As the incidence angle for plates 25 and 17 are slightly steeper (0.822° and 0.829° instead of 0.814° for plate 33), the reflectance decreases faster towards higher energies. From the position of the maximum and minimum in the logarithmic plot ( ), an Ir layer thickness of about 10 nm can be confirmed. The calculated reflectance using the nominal values and optical constants from the literature (Henke , 1993 ) is shown as a dashed line. | | Raster scan of the reflectance (double reflection) at a fixed grazing incidence angle of 0.814° over the central area of 17 plates. The reflectance remains constant at ( ) 4 keV, but it varies at ( ) 6 keV due to the slightly steeper angle of the lower plates having more influence at higher photon energies. The measurement positions on plates 33, 25 and 17 for the energy scans in Fig. 8 are indicated. | | Images from the large-area detector taken for strong variations of the grazing incidence angle from about 0.4° to 1.4° on an (slightly different) MM. After double reflection, the beam remains fixed at a detector angle of about 3.4°. At steeper incidence angles above 1.18°, which are far away from the angle in the NewAthena optics, the beam can traverse the pores after a single reflection, and its position depends on the incidence angle. | AcknowledgementsWe would like to thank all the people and institutions who have contributed to the development of silicon pore optics for X-ray astrophysics over the past two decades. Their contributions have been essential to the creation of the lens for the largest X-ray observatory ever to be flown. Funding informationThe following funding is acknowledged: European Space Agency (contract No. 4200019338/05/NL/HB). This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence , which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. Follow J. Synchrotron Rad. | ![](//2me.site/777/templates/cheerup/res/banner1.gif) |
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